Prof. Lianhua Jin
Professor at Univ of Yamanashi
SPIE Involvement:
Conference Program Committee | Author
Publications (22)

Proceedings Article | 20 September 2023 Paper
Yoriatsu Kitamura, Sota Mogi, Tsutomu Muranaka, Keisuke Arimoto, Eiichi Kondoh, Lianhua Jin, Bernard Gelloz
Proceedings Volume 12607, 126070M (2023) https://doi.org/10.1117/12.3005554
KEYWORDS: Reflection, Ellipsometry, Film thickness, Refractive index, Quartz, Optical transmission, Silicon films, Light sources and illumination, Glasses, Thin films

Proceedings Article | 19 November 2021 Paper
Motoyuki Ohtake, Masato Shibuya, Lianhua Jin
Proceedings Volume 12078, 120781H (2021) https://doi.org/10.1117/12.2603668
KEYWORDS: Zoom lenses, Lenses, Freeform optics, Modulation transfer functions, Distortion, Augmented reality, Solids, Objectives, Modulation, Medicine

Proceedings Article | 27 October 2021 Paper
Lianhua Jin, Takuma Ashizawa, Toru Yoshizawa
Proceedings Volume 11927, 119270A (2021) https://doi.org/10.1117/12.2616254

Proceedings Article | 10 October 2020 Presentation + Paper
Proceedings Volume 11552, 115520M (2020) https://doi.org/10.1117/12.2575305
KEYWORDS: Beam shaping, Optical testing, Image sensors, Light scattering, Opacity, Translucency, Sensors, Reflection, Laser scattering, Scattering

Proceedings Article | 20 August 2020 Presentation + Paper
Proceedings Volume 11500, 115000G (2020) https://doi.org/10.1117/12.2571088
KEYWORDS: Prisms, Zernike polynomials, Relays, Freeform optics, Aberration correction, Distortion, Mirrors, Glasses, Monochromatic aberrations

Showing 5 of 22 publications
Conference Committee Involvement (14)
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Showing 5 of 14 Conference Committees
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