Long Liu
at City Univ of Hong Kong
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 25 August 2009 Paper
L. Liu, Y. Huang, Y. Hung
Proceedings Volume 7375, 737547 (2009) https://doi.org/10.1117/12.839282
KEYWORDS: Speckle, Fringe analysis, Phase shifts, Phase shift keying, Speckle pattern, Shearography, Modulation, Phase shifting, Bismuth, Optical interferometry

SPIE Journal Paper | 1 May 2008
Y. Huang, Siu Pang Ng, Long Liu, Y. Chen, Y.Y. Hung
OE, Vol. 47, Issue 05, 054301, (May 2008) https://doi.org/10.1117/12.10.1117/1.2927462
KEYWORDS: Phase retrieval, Phase shifts, Fringe analysis, Shearography, Speckle pattern, Optical engineering, Fourier transforms, Phase measurement, Modulation, Phase shifting

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