Paper
1 September 1987 Performance Evaluation Of A Practical 248nm Wafer Stepper
Kenneth F. Walsh, Michael M. Dunn, David S. Holbrook, John H. Bruning
Author Affiliations +
Abstract
Optical steppers are expected by many workers to be applicable to design rules below 0.5 micrometers. In 1986 workers at Bell Labs reported exposure of features below 0.5 micrometers using a GCA optical stepper, incorporating an excimer laser source and a refractive Tropel lens designed to operate at 248nm. In addition to a light source, lens, wafer chuck and stages, a practical wafer stepper must incorporate alignment systems, reticle and wafer handling and control systems. If the stepper is illuminated by an excimer laser, safety systems must also be provided for protection from laser light, toxic gasses, and high voltage. The system should also be configured to enhance usability and maintainablity. We will discuss the concept and performance of such a stepper system, with emphasis on the performance of lens and illuminator.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenneth F. Walsh, Michael M. Dunn, David S. Holbrook, and John H. Bruning "Performance Evaluation Of A Practical 248nm Wafer Stepper", Proc. SPIE 0774, Lasers in Microlithography, (1 September 1987); https://doi.org/10.1117/12.940401
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Cited by 5 scholarly publications.
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KEYWORDS
Excimer lasers

Lens design

Semiconducting wafers

Control systems

Mercury

Optical lithography

Laser safety

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