A planar scanning probe microscope for near-field microscopy

Paul Weinbrenner; Stefan Ernst; Dominik M. Irber; Friedemann Reinhard

doi:10.1117/12.2568029

20 August 2020 A planar scanning probe microscope for near-field microscopy

Paul Weinbrenner, Stefan Ernst, Dominik M. Irber, Friedemann Reinhard

Proceedings Volume 11471, Quantum Nanophotonic Materials, Devices, and Systems 2020; 114710M (2020) https://doi.org/10.1117/12.2568029
Event: SPIE Nanoscience + Engineering, 2020, Online Only

Abstract

Scanning probe microscopy (SPM) traditionally employs a sharp tip as a sensor. This geometry is a problem for many modern near-field probes, such as NV centers in diamond, which cannot easily be placed on a tip. Here we present a novel, tipless approach - a technique to scan a planar probe parallel to a planar sample at a distance of few tens of nanometers. The core of our scheme are optical far-field techniques to measure both distance and tilt between the probe and the sample with sub-nm and sub-mrad precision. These measurements are employed as a feedback signal for positioning. Using this scheme, we demonstrate scanning near-field optical microscopy (SNOM) of plasmonic modes in silver nanowires using shallow NV centers in a bulk diamond. We will equally present ongoing experiments to implement a scanning nanogap cavity. S. Ernst et al., ACS Photonics 6, 327 (2019)

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Citation Download Citation

Paul Weinbrenner, Stefan Ernst, Dominik M. Irber, and Friedemann Reinhard "A planar scanning probe microscope for near-field microscopy", Proc. SPIE 11471, Quantum Nanophotonic Materials, Devices, and Systems 2020, 114710M (20 August 2020); https://doi.org/10.1117/12.2568029

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KEYWORDS

Near field scanning optical microscopy

Microscopy

Scanning probe microscopes

Diamond

Distance measurement

Scanning probe microscopy

Atomic force microscopy

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