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Stefan Ernst
at Technische Univ München
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Publications (1)
Proceedings Article | 20 August 2020 Presentation
A planar scanning probe microscope for near-field microscopy
Proceedings Volume 11471, 114710M (2020) https://doi.org/10.1117/12.2568029
KEYWORDS: Near field scanning optical microscopy, Scanning probe microscopes, Microscopy, Scanning probe microscopy, Diamond, Distance measurement, Atomic force microscopy, Optical components, Near field optics, Feedback signals
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