Developments at NIST on traceability in dimensional measurements

Dennis A. Swyt; Steven D. Phillips; John W. Palmateer

doi:10.1117/12.445626

22 October 2001 Developments at NIST on traceability in dimensional measurements

Dennis A. Swyt, Steven D. Phillips, John W. Palmateer

Proceedings Volume 4401, Recent Developments in Traceable Dimensional Measurements; (2001) https://doi.org/10.1117/12.445626
Event: Lasers in Metrology and Art Conservation, 2001, Munich, Germany

Abstract

This paper reports to the international community on recent developments in technical policies, programs, and capabilities at the U.S. (United States) National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to customers in calibration and measurement certificates, and a program to support the achievement of traceability to the SI (International System of Units) unit of length in dimensional measurements by manufacturers without direct recourse to a National Metrology Institute (NMI) for dimensional calibrations.

Citation Download Citation

Dennis A. Swyt, Steven D. Phillips, and John W. Palmateer "Developments at NIST on traceability in dimensional measurements", Proc. SPIE 4401, Recent Developments in Traceable Dimensional Measurements, (22 October 2001); https://doi.org/10.1117/12.445626

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