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5 March 2022 Tightly focused laser scanning excites displacement resonance
Yu-Lung Tang, Te-Hsin Yen, Tianyue Zhang, Chi-Kang Pai, Xiangping Li, Kuo-Ping Chen, Junichi Takahara, Shi-Wei Chu
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Proceedings Volume PC12006, Silicon Photonics XVII; PC120060A (2022) https://doi.org/10.1117/12.2609506
Event: SPIE OPTO, 2022, San Francisco, California, United States
Abstract
We study the scattering behavior of silicon nanoblocks in various displacements with respect to the optical axis of a tightly focused linearly polarized Gaussian beam. Experimentally, the laser scanning image of a single nanoblock deviates significantly from coherent image convolution. Theoretically, with exact Cartesian multipole decomposition, the results are explained through generation of high-order multipoles at large focus displacement and multipole interference. Surprisingly, due to the high-order multipoles, the efficiency of photothermal nonlinearity and Raman scattering are better with displaced focus. Our result extends Mie theory with displaced tight focus, opening up new opportunities in nanoscale light-matter interactions.
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Yu-Lung Tang, Te-Hsin Yen, Tianyue Zhang, Chi-Kang Pai, Xiangping Li, Kuo-Ping Chen, Junichi Takahara, and Shi-Wei Chu "Tightly focused laser scanning excites displacement resonance", Proc. SPIE PC12006, Silicon Photonics XVII, PC120060A (5 March 2022); https://doi.org/10.1117/12.2609506
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KEYWORDS
Laser scanners
Nanostructures
Mie scattering
Nanophotonics
Numerical simulations
Particles
Raman scattering
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