Characterization of layered scattering media using polarized light measurements and neural networks

Kai Y. Yong; Stephen P. Morgan; Ian M. Stockford; Mark C. Pitter

doi:10.1117/1.1578090

1 July 2003 Characterization of layered scattering media using polarized light measurements and neural networks

Kai Y. Yong, Stephen P. Morgan, Ian M. Stockford, Mark C. Pitter

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Journal of Biomedical Optics, Vol. 8, Issue 3, (July 2003). https://doi.org/10.1117/1.1578090

Measurements of the spatial distributions of polarized light backscattered from a two-layer scattering medium are used to train a neural network. We investigated whether the absorption coefficients and thickness of the layer can be determined when the scattering properties are known. When determining the absorption of the upper layer or the layer's thickness, polarized light measurements provide better performance than unpolarized measurements, demonstrating the sensitivity of polarized light to superficial tissue. Determination of the lower layer's absorption coefficient is not improved by polarized light measurements. Prior knowledge of the tissue under investigation is also beneficial because errors are reduced if the range of absorption or thickness is restricted.

©(2003) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Kai Y. Yong, Stephen P. Morgan, Ian M. Stockford, and Mark C. Pitter "Characterization of layered scattering media using polarized light measurements and neural networks," Journal of Biomedical Optics 8(3), (1 July 2003). https://doi.org/10.1117/1.1578090

Published: 1 July 2003

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