Mr. Aaron M. Michalko Profile

Aaron M. Michalko

at Lockheed Martin

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Publications (2)

SPIE Journal Paper | 1 June 2020

Development of a concave freeform surface measurement using transverse translation-diverse phase retrieval

Aaron Michalko, James Fienup

OE, Vol. 59, Issue 06, 064101, (June 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.6.064101

KEYWORDS: Wavefronts, Sensors, Mirrors, Wavefront aberrations, Phase retrieval, Freeform optics, Optical engineering, Optical spheres, Metrology, Optical testing

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Proceedings Article | 14 September 2018 Paper

Sensitivity study of transverse translation diverse phase retrieval for freeform metrology

Aaron Michalko, James Fienup

Proceedings Volume 10742, 107420T (2018) https://doi.org/10.1117/12.2321212

KEYWORDS: Wavefronts, Phase retrieval, Freeform optics, Metrology, Wavefront aberrations, Optical testing, Computer simulations

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