Dr. Abraham Mario Tapilouw Profile

Dr. Abraham Mario Tapilouw

Senior Engineer at Industrial Technology Research Institute

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 10 January 2025 Paper

Design and implementation of automatic optical surface defect inspection system of large aperture lenses

Abraham Mario Tapilouw, Yi-Wei Chang, Hau-Wei Wang, Kao-Der Chang, Leh-Rong Chang, Liang-Tang Chen, Chia-Ray Chen

Proceedings Volume 13267, 132670J (2025) https://doi.org/10.1117/12.3042662

KEYWORDS: Optical surfaces, Lenses, Inspection, Design, Defect inspection, Imaging systems, Optics manufacturing, High dynamic range imaging, Defect detection, Transmittance

Read Abstract +

Proceedings Article | 28 August 2016 Presentation + Paper

Reduction of batwing effect in white light interferometry for measurement of patterned sapphire substrates (PSS) wafer

Abraham Mario Tapilouw, Yi-Wei Chang, Long-Yo Yu, Hau-Wei Wang

Proceedings Volume 9960, 996006 (2016) https://doi.org/10.1117/12.2236874

KEYWORDS: Optical interferometry, Optical testing, Patterned sapphire substrate, Semiconducting wafers, Light emitting diodes, Light sources, Interferometry, Halogens, Algorithm development, Bandpass filters

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years