Dr. Anthony B. Hmelo
Professor at Vanderbilt Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 August 2005 Paper
Anthony Hmelo, Edward Belbusti, Mark Smith, Sean Brice, Robert Wheaton
Proceedings Volume 5933, 59330E (2005) https://doi.org/10.1117/12.617307
KEYWORDS: Safety, Nanotechnology, Nanolithography, Gases, Nanostructures, Electromagnetic coupling, Physics, Toxic gases, Nitrogen, Nano optics

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