Chengcheng Ren
at Xi'an Technological Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 November 2020 Paper
Proceedings Volume 11569, 1156906 (2020) https://doi.org/10.1117/12.2576305
KEYWORDS: Visibility, Spatial coherence, Double patterning technology, Spiral phase plates, Near field, Interferometry, Distortion, Optical testing, Beam propagation method

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