Dr. Drew T. Haven Profile

Dr. Drew T. Haven

R&D Manager at Luxium Solutions LLC.

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Publications (1)

Proceedings Article | 22 May 2015 Paper

Stress measurement of EFG sapphire using Cr3+ piezospectroscopy

Drew Haven, Herbert Bates, John Locher, Steven Zanella

Proceedings Volume 9453, 94530M (2015) https://doi.org/10.1117/12.2180655

KEYWORDS: Sapphire, Crystals, Luminescence, Nondestructive evaluation, Temperature metrology, Fiber optics, Transmittance, Manufacturing, Signal to noise ratio, Spectroscopy

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