Dr. Edward S. Kolesar Profile

Dr. Edward S. Kolesar

W.A. Moncrief Prof. of Engg. at Texas Christian Univ

SPIE Involvement:

Author

Proceedings Article | 2 August 2010 Paper

Integration of a fiber interferometer with a MEMS probe station

Tristan Tayag, Thiri Htun, Edward Kolesar

Proceedings Volume 7791, 77910R (2010) https://doi.org/10.1117/12.864252

KEYWORDS: Microelectromechanical systems, Interferometers, Demodulation, Optical fibers, Finite element methods, Actuators, Fiber optics, Interferometry, Digital signal processing, Systems modeling

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SPIE Journal Paper | 1 January 2003

Optical fiber interferometer for measuring the in situ deflection characteristics of MEMS structures

Tristan Tayag, Edward Kolesar, Kam Hoon, James Marchetti, Ijaz Jafri

OE, Vol. 42, Issue 01, (January 2003) https://doi.org/10.1117/12.10.1117/1.1525275

KEYWORDS: Microelectromechanical systems, Interferometers, Demodulation, Interferometry, Optical fibers, Finite element methods, Sensors, Signal to noise ratio, Magnetic sensors, Structured optical fibers

Proceedings Article | 30 April 2001 Paper

Design and performance of a polysilicon surface micromachined microengine realized with arrays of asymmetrical electrothermal microactuators

Edward Kolesar, Matthew Ruff, Simon Ko, Richard Wilks, Jeffrey Howard, Peter Allen, Josh Wilken, Jorge Bosch

Proceedings Volume 4407, (2001) https://doi.org/10.1117/12.425316

KEYWORDS: Microactuators, Microelectromechanical systems, Resistance, Actuators, Silicon, Thin films, Dielectrics, Glasses, Etching, Optical testing

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Proceedings Article | 15 August 2000 Paper

Theoretical and experimental characterization of the in-plane tip force and deflection achieved with asymmetrical polysilicon electrothermal microactuators

Peter Allen, Noah Boydston, Jeffrey Howard, Simon Ko, Edward Kolesar, Matthew Ruff, Josh Wilken, Richard Wilks

Proceedings Volume 4176, (2000) https://doi.org/10.1117/12.395623

KEYWORDS: Microactuators, Microelectromechanical systems, Actuators, Resistance, Silicon, Computer aided design, Dielectrics, Glasses, Etching, Metals

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Proceedings Article | 2 September 1999 Paper

Optical binary switch and amplitude modulator micromirror arrays

Edward Kolesar, Peter Allen, Noah Boydston, Jeffrey Howard, Simon Ko, Josh Wilken

Proceedings Volume 3878, (1999) https://doi.org/10.1117/12.361281

KEYWORDS: Micromirrors, Computer aided design, Electrodes, Microelectromechanical systems, Binary data, Finite element methods, Mirrors, Modulators, Reliability, Optical components

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SPIE Journal Paper | 1 April 1997

Reflection characteristics of porous silicon surfaces

Victor Bright, Edward Kolesar, David Sowders

OE, Vol. 36, Issue 04, (April 1997) https://doi.org/10.1117/12.10.1117/1.601422

KEYWORDS: Silicon, Reflectivity, Picosecond phenomena, Visible radiation, Mid-IR, Semiconducting wafers, Etching, Reflection, Surface finishing, Wafer-level optics

Proceedings Article | 17 September 1996 Paper

Silicon integrated microsensor incorporating a metal-doped phthalocyanine organic semiconductor used to selectively detect nitrogen dioxide and an organophosphorus compound

Edward Kolesar, John Wiseman

Proceedings Volume 2882, (1996) https://doi.org/10.1117/12.250724

KEYWORDS: Microsensors, Thin films, NOx, Silicon, Organic semiconductors, Silicon films, Transistors, Copper, Environmental sensing, Gases

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Proceedings Article | 15 September 1995 Paper

Silicon micromachined gas chromatographic system (SMGCS) for directly separating binary fugitive emissions of ammonia (NH3) and nitrigen dioxide (NO2)

Edward Kolesar, Rocky Reston

Proceedings Volume 2642, (1995) https://doi.org/10.1117/12.221159

KEYWORDS: NOx, Silicon, Capillaries, Sensors, Semiconducting wafers, Thin films, Chromatography, Micromachining, Nitrogen, Binary data

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Proceedings Article | 1 September 1995 Paper

Optical scattering enhanced by silicon micromachined surfaces

David Sowders, Victor Bright, Edward Kolesar

Proceedings Volume 2541, (1995) https://doi.org/10.1117/12.218323

KEYWORDS: Silicon, Bidirectional reflectance transmission function, Semiconducting wafers, Picosecond phenomena, Surface finishing, Etching, Laser scattering, Scattering, Fabrication, Scanning electron microscopy

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Proceedings Article | 1 November 1994 Paper

Low-intensity magnetic field detection with a magnetostrictive fiber optic interferometric sensor

Laura Picon, Edward Kolesar, Victor Bright

Proceedings Volume 2292, (1994) https://doi.org/10.1117/12.191828

KEYWORDS: Magnetism, Magnetic sensors, Magnetostrictive materials, Fiber optics sensors, Nickel, Optical fiber cables, Sensors, Fiber optics, Annealing, Laser optics

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Proceedings Article | 7 October 1994 Paper

Optical reflectance characterization of silicon micromachined surfaces

David Sowders, Victor Bright, Edward Kolesar

Proceedings Volume 2260, (1994) https://doi.org/10.1117/12.189216

KEYWORDS: Reflectivity, Silicon, Picosecond phenomena, Semiconducting wafers, Etching, Mid-IR, Visible radiation, Surface finishing, Polishing, Micromachining

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Showing 5 of 11 publications

Conference Committee Involvement (1)

Smart Sensors, Actuators, and MEMS II

9 May 2005 | Sevilla, Spain

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