Dr. Evan Ribnick Profile

Dr. Evan Ribnick

at 3M Co

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Publications (1)

SPIE Journal Paper | 16 August 2012

Non-orthogonal depth from focus for on-the-fly, three-dimensional inspection

Evan Ribnick

OE, Vol. 51, Issue 8, 083608, (August 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.8.083608

KEYWORDS: Inspection, Cameras, Imaging systems, 3D image processing, Sensors, Manufacturing, Optical engineering, Confocal microscopy, Calibration, Reconstruction algorithms

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