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Giuseppe A. Falci
at Univ di Catania
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Publications (1)
Proceedings Article | 17 February 2010 Paper
Preliminary radiation hardness tests of single photon Si detectors
R. Pagano, S. Libertino, G. Valvo, G. Condorelli, B. Carbone, A. Piana, M. Mazzillo, D. Sanfilippo, P. Fallica, F. Principato, G. Cannella, G. Falci, S. Lombardo
Proceedings Volume 7606, 760607 (2010) https://doi.org/10.1117/12.841740
KEYWORDS: Ions, X-rays, Silicon, Single photon, Sensors, Solids, Radiation effects, Oscilloscopes, Ion implantation, Optical filters
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