Jaeyeol Baek
at SAMSUNG SDI Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 March 2017 Paper
Huichan Yun, Jinhyung Kim, Youjung Park, Yoona Kim, Seulgi Jeong, Jaeyeol Baek, Byeri Yoon, Sanghak Lim
Proceedings Volume 10146, 1014624 (2017) https://doi.org/10.1117/12.2257880
KEYWORDS: System on a chip, Carbon, Double patterning technology, Polymers, Etching, Resistance, Fourier transforms, Optical lithography, Optical properties, Coating

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