Prof. Jeremy C. Sit Profile

Prof. Jeremy C. Sit

Associate Professor at Univ of Alberta

SPIE Involvement:

Author

Publications (20)

Proceedings Article | 1 March 2011 Paper

Numerical simulation and rational design of optically anisotropic columnar films

Viktor Leontyev, Matthew Hawkeye, Nicholas Wakefield, Kyrylo Tabunshchyk, Jeremy Sit, Andriy Kovalenko, Michael Brett

Proceedings Volume 7946, 79461Y (2011) https://doi.org/10.1117/12.873958

KEYWORDS: Refractive index, Polarization, Finite-difference time-domain method, Polarizers, Anisotropy, Thin films, Birefringence, Numerical simulations, Crystals, Titanium dioxide

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Proceedings Article | 5 February 2008 Paper

Using film nanostructure to control photoluminescence angular emission profiles

M. Taschuk, J. Gospodyn, J. Sit, M. Brett

Proceedings Volume 6890, 689005 (2008) https://doi.org/10.1117/12.763382

KEYWORDS: Thin films, Nanostructures, Lamps, Visible radiation, Spectroscopy, Optical coatings, Optical filters, Reflectivity, Mercury, Annealing

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Proceedings Article | 9 January 2008 Paper

Microstructured humidity sensors fabricated by glancing angle deposition: characterization and performance evaluation

Kathleen Krause, Andy van Popta, John Steele, Jeremy Sit, Michael Brett

Proceedings Volume 6800, 68000Y (2008) https://doi.org/10.1117/12.759533

KEYWORDS: Humidity, Sensors, Thin films, Adsorption, Refractive index, Nitrogen, Water, Fabrication, Optical coatings, Refraction

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Proceedings Article | 12 September 2007 Paper

Three-dimensional alignment of liquid crystals in nanostructured porous thin films

Nicholas Wakefield, Jeremy Sit

Proceedings Volume 6654, 665404 (2007) https://doi.org/10.1117/12.735265

KEYWORDS: Liquid crystals, Polymethylmethacrylate, Polarization, Thin films, Molecules, Silicon films, Optical properties, Silicon, Oxides, Nanostructures

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Proceedings Article | 10 September 2007 Paper

Thermal annealing of birefringent TiO2 thin films formed by oblique-angle deposition

Andy van Popta, June Cheng, Jeremy Sit, Michael Brett

Proceedings Volume 6647, 66470C (2007) https://doi.org/10.1117/12.735425

KEYWORDS: Thin films, Birefringence, Annealing, Crystals, Refractive index, Anisotropy, Transmittance, Thin film coatings, Scattering, Scanning electron microscopy

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Proceedings Article | 23 February 2006 Paper

Optical behaviour of hybrid LC/inorganic nanostructures

Nicholas Wakefield, Anastasia Elias, Michael Brett, Jeremy Sit

Proceedings Volume 6135, 61350G (2006) https://doi.org/10.1117/12.646458

KEYWORDS: Transmittance, Liquid crystals, Molecules, Optical properties, Polarization, Refractive index, Nanostructures, Switches, Absorption, Scanning electron microscopy

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Proceedings Article | 27 August 2005 Paper

Photonic device applications of nano-engineered thin film materials

Peter Hrudey, Andy van Popta, Jeremy Sit, Michael Brett

Proceedings Volume 5931, 593113 (2005) https://doi.org/10.1117/12.622281

KEYWORDS: Thin films, Optical coatings, Photonic crystals, Liquid crystals, Optical filters, Refractive index, Antireflective coatings, Humidity, Sensors, Scanning electron microscopy

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Proceedings Article | 27 August 2005 Paper

Effect of porosity on optical properties of chiral films

Jason Sorge, Andy van Popta, Jeremy Sit, Michael Brett

Proceedings Volume 5931, 59311D (2005) https://doi.org/10.1117/12.618032

KEYWORDS: Transmittance, Reflectivity, Thin films, Scattering, Birefringence, Light scattering, Reflection, Integrating spheres, Optical filters, Refractive index

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Proceedings Article | 20 August 2005 Paper

Double-handed circular Bragg reflection bands in chiral thin films

Andy van Popta, Jeremy Sit, Michael Brett

Proceedings Volume 5870, 587002 (2005) https://doi.org/10.1117/12.618039

KEYWORDS: Reflection, Thin films, Transmittance, Optical filters, Birefringence, Refractive index, Scanning electron microscopy, Stars, Anisotropy, Humidity

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Proceedings Article | 13 April 2005 Paper

Mueller matrix ellipsometry of multilayer porous columnar thin films with applications to square spiral photonic crystals

James Gospodyn, Mark Summers, Michael Brett, Jeremy Sit

Proceedings Volume 5733, (2005) https://doi.org/10.1117/12.590921

KEYWORDS: Thin films, Photonic crystals, Ellipsometry, Silicon, Electron beam lithography, Scanning electron microscopy, Refraction, Data modeling, Silicon films, Multilayers

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Proceedings Article | 20 December 2004 Paper

Chiral and nanostructured optical materials

Matthew Hawkeye, Andy van Popta, Jeremy Sit, Michael Brett

Proceedings Volume 5577, (2004) https://doi.org/10.1117/12.567559

KEYWORDS: Thin films, Polarization, Reflection, Nanostructures, Optical properties, Refractive index, Reflectivity, Gradient-index optics, Fabrication, Transmittance

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Proceedings Article | 8 September 2004 Paper

Optical properties of porous helical thin films and the effects of post-deposition annealing

Andy van Popta, Jeremy Sit, Michael Brett

Proceedings Volume 5464, (2004) https://doi.org/10.1117/12.545923

KEYWORDS: Liquid crystals, Annealing, Thin films, Refractive index, Reflection, Nanostructures, Scanning electron microscopy, Dielectrics, Scattering, Crystals

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Proceedings Article | 5 January 2004 Paper

Optical performance of porous TiO2 chiral thin films

Andy van Popta, Scott Kennedy, Dirk Broer, Jeremy Sit, Michael Brett

Proceedings Volume 5213, (2004) https://doi.org/10.1117/12.506281

KEYWORDS: Liquid crystals, Thin films, Reflectivity, Refractive index, Optical activity, Reflection, Spectrophotometry, Transmittance, Light scattering, Solids

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Proceedings Article | 5 January 2004 Paper

Thin film/liquid crystal composite optical materials

Jeremy Sit, Michael Brett

Proceedings Volume 5213, (2004) https://doi.org/10.1117/12.508657

KEYWORDS: Liquid crystals, Thin films, Optical activity, Switching, LCDs, Composites, Crystals, Optical properties, Crystal optics, Dichroic materials

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Proceedings Article | 24 November 2003 Paper

Luminescence of nanostructured Y2O3:Eu thin films fabricated using glancing angle deposition techniques

Peter Hrudey, Mike Taschuk, Ying Tsui, Robert Fedosejevs, Jeremy Sit, Michael Brett

Proceedings Volume 5224, (2003) https://doi.org/10.1117/12.506266

KEYWORDS: Europium, Silicon films, Thin films, Silicon, Oxygen, Luminescence, Nanostructures, Sapphire, Annealing, Nanolithography

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Proceedings Article | 14 May 2002 Paper

Optical behavior of chiral thin film-liquid crystal composite materials

Michael Brett, Jeremy Sit, Scott Kennedy, Ken Harris, Dick Broer

Proceedings Volume 4658, (2002) https://doi.org/10.1117/12.467449

KEYWORDS: Liquid crystals, Photoresist materials, Thin films, Optical properties, Molecules, Composites, Glasses, Switching, Silicon films, Aluminum

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Proceedings Article | 24 October 2000 Paper

Characterization of optical devices based on liquid crystals embedded in porous thin films

Jeremy Sit, Scott Kennedy, Dick Broer, Michael Brett

Proceedings Volume 4107, (2000) https://doi.org/10.1117/12.405315

KEYWORDS: Liquid crystals, Thin films, Optical properties, Switching, Composites, Polarization, Optical components, Optical alignment, Optical testing, Glasses

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Proceedings Article | 27 October 1999 Paper

Chiral porous thin film/liquid crystal hybrid materials

Kevin Robbie, Jeremy Sit, Dick Broer, Michael Brett

Proceedings Volume 3803, (1999) https://doi.org/10.1117/12.366758

KEYWORDS: Liquid crystals, Polymers, Magnesium fluoride, LCDs, Molecules, Optical alignment, Thin films, Switching, Reflection, Glasses

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Proceedings Article | 30 June 1999 Paper

Glancing angle deposition: recent research results

Michael Brett, Mary Seto, Jeremy Sit, Ken Harris, Doug Vick, Kevin Robbie

Proceedings Volume 3790, (1999) https://doi.org/10.1117/12.351243

KEYWORDS: Thin films, Sputter deposition, Titanium, Fabrication, Scanning electron microscopy, Zirconium dioxide, Atomic force microscopy, Electron beams, Solids, Silicon

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Proceedings Article | 30 June 1999 Paper

Optical properties of chiral thin films fabricated by glancing angle deposition

Jeremy Sit, Scott Kennedy, Dick Broer, Michael Brett

Proceedings Volume 3790, (1999) https://doi.org/10.1117/12.351250

KEYWORDS: Thin films, Optical properties, Polarization, Thin film deposition, Spectroscopy, Reflection, Refractive index, Polarizers, Sensors, Wave plates

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Showing 5 of 20 publications

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