John W. Devitt
Principal Fellow at RTX Corp
SPIE Involvement:
Conference Program Committee | Author
Publications (19)

Proceedings Article | 12 April 2021 Presentation
Proceedings Volume 11740, 117400U (2021) https://doi.org/10.1117/12.2591825
KEYWORDS: Photonics, Electro optics, Radio optics, Photonic devices, Infrared radiation, Infrared imaging, Imaging devices, Electro optical systems, Computer programming

SPIE Journal Paper | 1 November 2010
OE, Vol. 49, Issue 11, 113202, (November 2010) https://doi.org/10.1117/12.10.1117/1.3505866
KEYWORDS: Sensors, Modulation transfer functions, Panoramic photography, Mid-IR, Imaging systems, Cameras, Thermal modeling, Electronics, Black bodies, Mirrors

Proceedings Article | 4 May 2010 Paper
Proceedings Volume 7660, 766005 (2010) https://doi.org/10.1117/12.850254
KEYWORDS: Sensors, Electronics, Cameras, Imaging systems, Nonuniformity corrections, Modulation transfer functions, Panoramic photography, Mid-IR, Infrared sensors, Radio optics

Proceedings Article | 7 May 2009 Paper
K. Choi, D. Forrai, D. Endres, J. Sun, P. Pinsukanjana, J. Devitt
Proceedings Volume 7298, 729807 (2009) https://doi.org/10.1117/12.816617
KEYWORDS: Sensors, Staring arrays, Quantum wells, Quantum efficiency, Doping, Readout integrated circuits, Quantum well infrared photodetectors, Electrons, Performance modeling, Neodymium

Proceedings Article | 3 September 2008 Paper
K. Choi, D. Forrai, D. Endres, J. Sun, P. Pinsukanjana, J. Devitt
Proceedings Volume 7082, 708208 (2008) https://doi.org/10.1117/12.792556
KEYWORDS: Staring arrays, Quantum efficiency, Sensors, Absorption, Quantum wells, Readout integrated circuits, Quantum well infrared photodetectors, Doping, Neodymium, Black bodies

Showing 5 of 19 publications
Conference Committee Involvement (15)
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXVI
13 April 2025 | Orlando, Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV
23 April 2024 | National Harbor, Maryland, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIV
3 May 2023 | Orlando, Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIII
6 April 2022 | Orlando, Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXII
12 April 2021 | Online Only, Florida, United States
Showing 5 of 15 Conference Committees
Course Instructor
NON-SPIE: UCSB Infrared Technology
NON-SPIE: GTRI Infrared Technology
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