Dr. Jorge Chao-Ortiz
at Indra Sistemas SA
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 July 2024 Poster + Paper
Proceedings Volume 13096, 130964W (2024) https://doi.org/10.1117/12.3020119
KEYWORDS: Tolerancing, Error analysis, Wavefront errors, Spectrographs, Optical alignment, Manufacturing, Design, Optical surfaces, Mirrors, Statistical analysis, Astronomical instrumentation

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