Dr. Joy M. Barker
Senior Member/Technical Staff at Sandia National Labs
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 September 2008 Paper
Christopher Orendorff, Joy Barker, Adam Rowen, W. Graham Yelton, Christian Arrington, J. Rusty Gillen
Proceedings Volume 7039, 70390R (2008) https://doi.org/10.1117/12.795287
KEYWORDS: Indium, Metals, Photomasks, Photoresist materials, Lithography, Silicon, Scanning electron microscopy, Chemistry, Semiconducting wafers, Particles

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