Prof. Kohki Okabe
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 March 2024 Presentation
Keiichiro Toda, Masaharu Takarada, Genki Ishigane, Hiroyuki Shimada, Venkata Ramaiah Badarla, Kohki Okabe, Takuro Ideguchi
Proceedings Volume PC12855, PC1285513 (2024) https://doi.org/10.1117/12.3003105
KEYWORDS: Temperature metrology, Optical tomography, Mid-IR, Diffraction, Thermometry, Thermography, Nanoprobes

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