Mr. Kun Wang Profile

Kun Wang

at Technische Univ München

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Author

Publications (7)

Proceedings Article | 5 March 2021 Presentation + Paper

Optical fiber sensors based on multimode interference using square-core fiber for temperature measurement

Kun Wang, Xingchen Dong, Michael Köhler, Patrick Kienle, Qiang Bian, Maximilian Fink, Martin Jakobi, Alexander Koch

Proceedings Volume 11693, 116930R (2021) https://doi.org/10.1117/12.2577571

KEYWORDS: Fiber optics sensors, Multimode fibers, Temperature metrology, Structured optical fibers, Single mode fibers, Sensors, Multimode interference devices, Fusion splicing, Brain-machine interfaces, Cladding

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Proceedings Article | 20 September 2020 Presentation + Paper

Compact static Fourier transform spectrometer for time-resolved mid-infrared spectroscopy

Michael Köhler, Bastian Vauth, Clara Kiesselbach, Xingchen Dong, Kun Wang, Patrick Kienle, Michael Schardt, Carsten Giebeler, Benjamin Wiesent, Alexander Koch

Proceedings Volume 11537, 1153707 (2020) https://doi.org/10.1117/12.2571489

KEYWORDS: Spectroscopy, Mid-IR, Fourier transforms, Time resolved spectroscopy, Spectral resolution, Light sources, FT-IR spectroscopy, Fourier optics, Signal to noise ratio, Mirrors

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Proceedings Article | 20 August 2020 Presentation + Paper

Increasing the sensitivity of laser triangulation systems using structured optical surfaces

Patrick Kienle, Michael Köhler, Kun Wang, Martin Jakobi, Alexander Koch

Proceedings Volume 11500, 115000J (2020) https://doi.org/10.1117/12.2566094

KEYWORDS: Distance measurement, Sensors, Image sensors, Modulation, Laser systems engineering, Optical simulations, Laser scattering, Detection and tracking algorithms

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Proceedings Article | 20 August 2020 Poster + Paper

Line-scan hyperspectral imaging microscopy with structured illumination

Xingchen Dong, Zhendong Li, Jie Dong, Kun Wang, Michael Köhler, Martin Jakobi, Alexander Koch

Proceedings Volume 11508, 115080U (2020) https://doi.org/10.1117/12.2565944

KEYWORDS: Hyperspectral imaging, Microscopy, Microscopes, Line scan image sensors, Spatial resolution, Phase shifts, Digital Light Processing, Control systems

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Proceedings Article | 30 March 2020 Presentation + Paper

Mapping the optical dielectric response of isolated monolayer MoS2 by push-broom microspectroscopy

Xingchen Dong, Michael Köhler, Kun Wang, Martin Jakobi, Alexander Koch

Proceedings Volume 11351, 113511I (2020) https://doi.org/10.1117/12.2540501

KEYWORDS: Dielectrics, Imaging spectroscopy, Molybdenum, Refractive index, Reflectivity, Light-matter interactions, Optical properties, Spectroscopy, Hyperspectral imaging, Microscopy

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Two-dimensional van der Waals materials are attractive for photonics and optoelectronics due to distinctive layerdependent optical properties. Optical properties based on light-matter interactions have been revealed by modern imaging and spectroscopy techniques. Hyperspectral imaging microscopy working in line-scan mode (push-broom microspectroscopy) can provide abundant spectral information covering a large area compared to conventional spectroscopy techniques, with a higher acquisition speed than point-scan techniques such as atomic force microscopy and Raman imaging microscopy. This contribution studies in-depth the reconstruction of 3D datacubes and the extraction of optical responses of the sample. Monolayer MoS₂, a subclass of semiconducting two-dimensional materials, is fabricated by the mechanical exfoliation method on the SiO₂/Si substrate with an oxide thickness of 285 nm. The isolated monolayer MoS₂ is observed and identified by a conventional optical microscope. The custom-built push-broom microspectroscope is utilized to scan the region of interest, with the whole spectrum of every line recorded at each frame. The spectral information of every point is collected and 3D spectral data sets are reconstructed for feature extraction and property analysis. To realize the thickness mapping of flakes, linear unmixing is employed to calculate the abundance of isolated monolayer MoS₂ on the SiO₂/Si substrate, improving flake identification performances. The characteristic spectrum of monolayer MoS₂ is acquired by averaging the spectrum from the monolayer MoS₂ flake. Furthermore, the optical dielectric response is further analyzed by Kramers-Kronig constrained analysis and Fresnel-law-based analysis. The optical dielectric function is calculated and compared based on the refractive index and medium thickness. This detailed analysis of optical dielectric responses highlights the feasibility of push-broom microspectroscopy for two-dimensional materials characterization.

Proceedings Article | 3 September 2019 Paper

Static Fourier transform mid-infrared spectrometer with continuous background correction

Michael Köhler, Michael Schardt, Hamza Ghazala, Ennio Colicchia, Patrick Kienle, Xingchen Dong, Kun Wang, Alexander Koch

Proceedings Volume 11102, 1110218 (2019) https://doi.org/10.1117/12.2528404

KEYWORDS: Mirrors, Spectroscopy, Sensors, Fourier transforms, FT-IR spectroscopy, Beam splitters, Light sources, Off axis mirrors, Interferometers, Transmittance

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SPIE Journal Paper | 27 June 2014

Subpixel edge localization with reduced uncertainty by violating the Nyquist criterion

Philipp Heidingsfelder, Jun Gao, Kun Wang, Peter Ott

OE, Vol. 53, Issue 12, 122410, (June 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.12.122410

KEYWORDS: Error analysis, Sensors, Electrons, Signal to noise ratio, Spatial frequencies, Optical engineering, Microscopes, Edge detection, Solids, Computer simulations

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Showing 5 of 7 publications

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