Dr. Lei Zhang
at Shanghai Institute of Technical Physics
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 January 2005 Paper
Bin Li, Suying Zhang, Ping Xie, L. Zhang, Dingquan Liu, Fengshan Zhang
Proceedings Volume 5640, (2005) https://doi.org/10.1117/12.570365
KEYWORDS: Germanium, Thin films, Lead, Tellurium, Refractive index, Infrared radiation, Temperature metrology, Interference filters, Transmittance, Absorption

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