Scattering-type scanning near-field optical microscopy (s-SNOM) is a useful tool for the non-destructive investigation of buried confined electron systems with nanoscale resolution, however, a clear separation of carrier concentration and mobility was often not possible. Here, we predict a characteristic (“fingerprint”) response of the LaAlO3/SrTiO3 2DEG in the mid-infrared spectral range, which was not experimentally accessible in the past, and verify this using a state-of-the-art tunable narrow-band laser in cryo-s-SNOM at 8 K. Our modelling allows us to separate the influence of carrier concentration and mobility on fingerprint near-field spectra, which we use to characterize 2DEG inhomogeneities on the nanoscale.
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