Marc B. Airola
at Johns Hopkins Applied Physics Lab LLC
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 13 May 2019 Paper
M. Airola, M. Thomas, J. Ma, D. Hahn, K. Hibbitts, D. Blaney
Proceedings Volume 10985, 1098504 (2019) https://doi.org/10.1117/12.2519457
KEYWORDS: Chemical vapor deposition, Ultraviolet radiation, Crystals, Infrared radiation, Scatter measurement, Absorption, Visible radiation, Data modeling, Surface finishing, Mid-IR

Proceedings Article | 13 May 2019 Paper
Proceedings Volume 10985, 1098502 (2019) https://doi.org/10.1117/12.2518957
KEYWORDS: Absorption, Sapphire, Scattering, Spinel, Transmittance, Crystals, Reflectivity, Scatter measurement, Laser scattering, Laser beam diagnostics

Proceedings Article | 4 September 2018 Presentation + Paper
M. Thomas, J. Ma, M. Airola, P. McGuiggan
Proceedings Volume 10750, 107500F (2018) https://doi.org/10.1117/12.2323108
KEYWORDS: Reflection, Reflectivity, Nondestructive evaluation, Diffraction, Scattering, Absorption, Data modeling, Bidirectional reflectance transmission function, Laser scattering

Proceedings Article | 25 May 2018 Paper
M. Thomas, M. Airola, J. Makowski
Proceedings Volume 10631, 1063117 (2018) https://doi.org/10.1117/12.2305424
KEYWORDS: Temperature metrology, Infrared radiation, Reflectivity, Water, Oscillators, Contamination, Long wavelength infrared, Absorption, Refraction, Liquids

Proceedings Article | 31 October 2014 Paper
Michele Lohr, Raymond Sova, Kevin Funk, Marc Airola, Michael Dennis, Richard Pavek, Jennifer Hollenbeck, Sean Garrison, Steven Conard, David Terry
Proceedings Volume 9254, 92540S (2014) https://doi.org/10.1117/12.2068251
KEYWORDS: Radar, Infrared sensors, Long wavelength infrared, Sensors, Calibration, Infrared cameras, Visible radiation, Ka band, Ranging, Mid-IR

Showing 5 of 14 publications
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