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Dr. Markus Rueckel
at BASF SE
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Author
Publications (1)
Proceedings Article | 29 August 2006 Paper
Coherence-gated wavefront sensing using a virtual Shack-Hartmann sensor
Markus Rueckel, Winfried Denk
Proceedings Volume 6306, 63060H (2006) https://doi.org/10.1117/12.677923
KEYWORDS: Wavefronts, Speckle, Wavefront sensors, Sensors, Diffraction, Wavefront reconstruction, Error analysis, Cameras, Multiphoton microscopy, Microscopy
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