Michael J. Bender
Mechanical Engineer at BAE Systems
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 September 2007 Paper
Michael Bender, Robert Guyer, Thomas Fenton
Proceedings Volume 6665, 666502 (2007) https://doi.org/10.1117/12.735701
KEYWORDS: Domes, Silicon, Safety, Titanium, Stress analysis, Infrared countermeasures, Epoxies, Prototyping, Failure analysis, Manufacturing

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