Minoru Kitada
at Dai Nippon Printing Co Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 9 November 2005 Paper
Proceedings Volume 5992, 59924R (2005) https://doi.org/10.1117/12.630114
KEYWORDS: Photomasks, Data corrections, Distortion, Silicon, Electron beam lithography, Metrology, Mask making, Data modeling, Semiconducting wafers, Printing

Proceedings Article | 28 June 2005 Paper
Proceedings Volume 5853, (2005) https://doi.org/10.1117/12.617290
KEYWORDS: Photomasks, Distortion, Charged-particle lithography, Electron beam direct write lithography, Silicon, Image analysis, Lithography, Metrology, Semiconducting wafers, Error analysis

Proceedings Article | 20 August 2004 Paper
Yuuki Aritsuka, Minoru Kitada, Masaru Kurosawa, Tadahiko Takikawa, Hiroshi Fujita, Hisatake Sano, Morihisa Hoga, Naoya Hayashi
Proceedings Volume 5446, (2004) https://doi.org/10.1117/12.557777
KEYWORDS: Photomasks, Semiconducting wafers, Charged-particle lithography, Silicon, Electron beam lithography, Optical testing, Projection lithography, Oxides, Doping, Etching

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