Dr. Nicholas X. Randall Profile

Dr. Nicholas X. Randall

Vice President at CSM Instruments Inc

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Publications (3)

Proceedings Article | 22 January 2005 Paper

Characterization of the mechanical properties of MEMS devices using nanoscale techniques

Nicholas Randall

Proceedings Volume 5716, (2005) https://doi.org/10.1117/12.592772

KEYWORDS: Microelectromechanical systems, Silicon, Coating, Microfabrication, Resistance, Switches, Photomicroscopy, Printing, Head, Atomic force microscopy

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Proceedings Article | 2 October 2001 Paper

Characterization of MEMS mechanical properties using nanoscale techniques

Nicholas Randall, Richard Soden

Proceedings Volume 4558, (2001) https://doi.org/10.1117/12.443015

KEYWORDS: Microelectromechanical systems, Silicon, Printing, Head, Coating, Resistance, Switches, Magnetism, Manufacturing, Metals

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Proceedings Article | 28 July 1994 Paper

Characterization of microoptical elements by a stand-alone atomic-force microscope

J. Burger, Nicholas Randall, Rainer Christoph, Lei Yan, Olivier Parriaux

Proceedings Volume 2213, (1994) https://doi.org/10.1117/12.180984

KEYWORDS: Optical components, Diffraction gratings, Microfabrication, Fresnel lenses, Nondestructive evaluation, Diffractive optical elements, Diffraction, Atomic force microscopy, Waveguides, Control systems

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