Dr. Nishath Verghese
Vice President R&D Design Products at Cadence Design Systems Inc
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Author
Publications (9)

Proceedings Article | 3 April 2010 Paper
Li-Fu Chang, Julia Fu, Josh Yang, Elain Zou, Philippe Hurat, Nishath Verghese, Hua Ding
Proceedings Volume 7641, 76410F (2010) https://doi.org/10.1117/12.848018
KEYWORDS: Lithography, Databases, Etching, Silicon, Diffusion, Design for manufacturing, Transistors, Optical proximity correction, Critical dimension metrology, Model-based design

Proceedings Article | 11 March 2010 Open Access Paper
Laurent Le Cam, Andy Appleby, Philippe Hurat, Benoit Carpentier, Kuang-Han Chen, Nishath Verghese
Proceedings Volume 7641, 764106 (2010) https://doi.org/10.1117/12.848023
KEYWORDS: Semiconductors, Lithography, Databases, Metals, Manufacturing, Design for manufacturing, System on a chip, Model-based design, Chemical mechanical planarization, Design for manufacturability

Proceedings Article | 13 March 2009 Paper
Kayvan Sadra, Mark Terry, Arjun Rajagopal, Robert Soper, Donald Kolarik, Tom Aton, Brian Hornung, Rajesh Khamankar, Philippe Hurat, Bala Kasthuri, Yajun Ran, Nishath Verghese
Proceedings Volume 7275, 72750K (2009) https://doi.org/10.1117/12.816485
KEYWORDS: Lithography, Logic, Statistical analysis, Capacitors, Data modeling, Computer simulations, Design for manufacturing, Transistors, Optical proximity correction, Convolution

Proceedings Article | 13 March 2009 Paper
Lionel Riviere-Cazaux, Philippe Hurat, Bala Kasthuri, Larry Layton, Nishath Verghese
Proceedings Volume 7275, 727506 (2009) https://doi.org/10.1117/12.813969
KEYWORDS: Lithography, Logic, Silicon, Reliability, Design for manufacturing, Photomasks, Transistors, Field effect transistors, Optimization (mathematics), Tolerancing

Proceedings Article | 19 March 2008 Paper
Raphael Bingert, Alain Aurand, Jean-Claude Marin, Eric Balossier, Thierry Devoivre, Yorick Trouiller, Florent Vautrin, Nishath Verghese, Richard Rouse, Michel Cote, Philippe Hurat
Proceedings Volume 6925, 69250M (2008) https://doi.org/10.1117/12.772897
KEYWORDS: Lithography, Data modeling, Etching, Silicon, Shape analysis, Transistors, Molybdenum, Model-based design, Device simulation, Instrument modeling

Showing 5 of 9 publications
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