Random duty-cycle errors (RDE) in ferroelectric quasi-phase-matching (QPM) devices not only affect the frequency conversion efficiency, but also generate non-phase-matched background noise. Although such noise contribution can be evaluated by measuring second-harmonic generation (SHG) spectrum with tunable narrow-band lasers, the limited tuning ranges usually results in inaccurate measurement of pure noise. Instead of SHG, we took a diffraction pattern which is mathematically equivalent to the SHG spectrum, but can be obtained with greater simplicity. With our proposed method applied to periodically poled lithium niobate, RDE could be evaluated more accurately from the pure background noise measurement.
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