Optical systems, which operate over a wide range of Fresnel numbers, are often times performance-limited by diffraction effects. In order to characterize such effects at the 40-100 picometer level, a diffraction testbed has been built which has the capability of measuring diffraction effects at this level. Concurrently, mathematical diffraction modeling tools have been developed that propagate an input wavefront through an optical train, while retaining amplitude and phase information at a grid resolution sufficient for yielding picometer-resolution diffraction test data. This paper contains a description of this diffraction hardware testbed, the diffraction modeling approach, and a comparison of the modeled and hardware test results, which then serves as validation of the diffraction modeling methodology.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.