Dr. Robert Bryll
Research Scientist/Vision Systems at Mitutoyo Research & Development America Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 February 2008 Paper
Proceedings Volume 6813, 681309 (2008) https://doi.org/10.1117/12.766715
KEYWORDS: Calibration, Monochromatic aberrations, Light sources and illumination, Image sensors, Machine vision, Metals, Industrial metrology, Image processing, Microscopy, Optical aberrations

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