Dr. Shenghui Lei
Member of Technical Staff at Bell Labs Research Ctr Ireland
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 June 2015 Paper
Ian Mathews, Shenghui Lei, Kevin Nolan, Guillaume Levaufre, Alexandre Shen, Guang-Hua Duan, Brian Corbett, Ryan Enright
Proceedings Volume 9520, 95200J (2015) https://doi.org/10.1117/12.2178924
KEYWORDS: Aluminum nitride, Silicon, Cladding, Thin films, Sputter deposition, Thermal effects, Thermography, Waveguides, Refractive index, Interfaces

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