Mr. Shengzhi Xu Profile

Shengzhi Xu

at Soochow Univ

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 9 October 2021 Poster + Paper

Resolution-enhanced phase retrieval for fringe reflection technology with structured light illumination

Xianmeng Shen, Maoyun Ren, Suodong Ma, Shengzhi Xu, Mingrui Liu, LiChen Zheng

Proceedings Volume 11899, 118991D (2021) https://doi.org/10.1117/12.2603764

KEYWORDS: Fringe analysis, Structured light, Optical transfer functions, Phase retrieval, Phase shifts, Super resolution, Image processing, Cameras, Reflection, Linear filtering

Read Abstract +

Owing to its advantages of simple system structure, large dynamic range and high measurement accuracy, fringe reflection technique (FRT) is becoming a powerful tool for specular free-form surface testing in the fields of reverse engineering, defect inspection, optical manufacturing, etc. However, due to the optical transfer function (OTF) of the FRT optical system, high-frequency information on the surface of an element under test is easily lost, which affects the high-precision acquisition of three-dimensional (3D) topography especially in microscopic measurement. Although the above problem can be suppressed to some extent by using or designing high-performance optical systems, the significant increase in the complexity and cost of the measurement system is sometimes unacceptable. To overcome the afore mentioned issue, a resolution-enhanced phase retrieval algorithm based on structured illumination microscopy (SIM) for FRT with an ordinary optical system is proposed in this paper. The combination of FRT and SIM is realized by projecting conventional phase-shifting fringe patterns in multiple directions. In principle, resolution-enhanced phase retrieval with super-diffraction limitation (up to twice the pass band of OTF) can be realized through spectrum extraction, stitching and shifting. A low cost, compact, coaxial FRT setup based on open-source hardware is designed and built for experimental verification. Simulations and experimental results demonstrate the effectiveness of the proposed technique.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years