Tianshuang Han
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 December 2022 Presentation + Paper
Proceedings Volume 12315, 123150H (2022) https://doi.org/10.1117/12.2641994
KEYWORDS: Speckle, Cameras, Speckle interferometry, Imaging systems, 3D metrology, Defect detection, 3D vision, Calibration

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