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Tobias Wollandt
at Max-Planck-Institut für Festkörperforschung
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Publications (1)
Proceedings Article | 20 August 2020 Poster
Limitations of the tuning of interface dipoles for the reduction of the contact resistance in organic thin-film transistors
James Borchert, Tobias Wollandt, Ute Zschieschang, Florian von Wrochem, Boyu Peng, Paddy K. Chan, R. Thomas Weitz, Klaus Kern, Sabine Ludwigs, Hagen Klauk
Proceedings Volume 11476, 1147616 (2020) https://doi.org/10.1117/12.2568003
KEYWORDS: Resistance, Interfaces, Thin films, Transistors, Natural surfaces, Metals, Dielectrics, Ultraviolet radiation, Photoemission spectroscopy
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