Volkmar Eichhorn
at Carl von Ossietzky Univ Oldenburg
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 May 2007 Paper
Sergej Fatikow, Volkmar Eichhorn, Florian Krohs, Iulian Mircea, Christian Stolle, Saskia Hagemann
Proceedings Volume 6589, 65891H (2007) https://doi.org/10.1117/12.715630
KEYWORDS: Sensors, Atomic force microscopy, Scanning electron microscopy, Control systems, Carbon nanotubes, Calibration, Optical microscopes, Computer architecture, Microscopes, Nanorobotics

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