Mr. Xun Ouyang Profile

Xun Ouyang

at Stevens Inst of Technology

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 17 January 2003 Paper

Xun Ouyang, Ronald Besser

Proceedings Volume 4982, (2003) https://doi.org/10.1117/12.472739

KEYWORDS: Silicon, Control systems, Chemical analysis, Chemical reactions, Gases, Calibration, Micromachining, Surgery, Sensors, Fabrication

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Keywords/Phrases