Mr. Yifei Li Profile

Yifei Li

at Massachusetts Institute of Technology

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 9 September 2019 Presentation + Paper

Yifei Li, Akshay Singh, Sergiy Krylyuk, Albert Davydov, R. Jaramillo

Proceedings Volume 11085, 110850T (2019) https://doi.org/10.1117/12.2532602

KEYWORDS: Reflectivity, Refractive index, FT-IR spectroscopy, Near infrared, Ellipsometry, Semiconductors, Integrated photonics, Chalcogenides

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Keywords/Phrases