Yohei Sogabe
at Nippon Control System Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 November 2024 Poster + Paper
Ai Kaneko, Yohei Sogabe, So Yanaihara, Toshikazu Nagatani, Taigo Fujii, Tomokazu Hayashi, Masakazu Hamaji
Proceedings Volume 13216, 1321622 (2024) https://doi.org/10.1117/12.3034585
KEYWORDS: Data corrections, Data processing, Bias correction, Tolerancing, Deformation, Data conversion, Metals, Error analysis, SRAF, Mask making

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