Dr. Yves Moser
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 29 August 2022 Presentation + Paper
Stephen Watson, Raziye Artan, David Atkinson, Steven Beard, Martin Black, Ciaran Breen, Ian Bryson, Jose Carrera, Stefane Caseiro, Lee Chapman, Stephen Chittick, William Cochrane, Miriam Colling, Oscar Gonzalez, Markus Hug, Ciaran Lawrence, Alexander Lay, David Montgomery, Yves Moser, Johannes Nix, Alan O'Brien, Phil Rees, William Taylor, Bart Willemse
Proceedings Volume 12188, 1218829 (2022) https://doi.org/10.1117/12.2627329
KEYWORDS: Metrology, Resistance, Cameras, Calibration, Spectrographs, Computer aided design, Optical alignment, Connectors, Tolerancing, Microsystems

Proceedings Article | 13 December 2020 Presentation + Paper
Steve Watson, David Atkinson, Steven Beard, Martin Black, Ian Bryson, Jose Carrera, Stefane Caserio, Lee Chapman, William Cochrane, Miriam Colling, Alasdair Fairley, Oscar Gonzalez, Markus Hug, Ciaran Lawrence, Alexander Lay, David Montgomery, Yves Moser, Johannes Nix, Alan O'Brien, Phil Rees, William Taylor, Bart Willemse
Proceedings Volume 11451, 1145127 (2020) https://doi.org/10.1117/12.2563319
KEYWORDS: Visible radiation, Spectrographs, Spectroscopes, Multiplexing, Astronomy, Microsystems, Product engineering

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