The detection of defects is one of the most crucial aspects of the manufacturing industry. There are many methods in the aspects of defects detection on the specular surface. However, in some cases, the detection results may be disturbed by the dusts on the specular surface. In this paper, a method which is based on the polarized structured-light illumination is proposed to detect the defects of specular surface with eliminating dusts. A linear polarizer is added to the structuredlight illumination system, and by controlling the polarization direction of the polarizer the dusts can be detected separately and removed in the end. Experiment results proved the effectiveness of the proposed method.
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