Mr. Eric C. Nolan Profile

Eric C. Nolan

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Proceedings Article | 22 April 2020 Presentation + Paper

Electromechanical impedance based structural health monitoring measuring system in the millisecond timescale

Eric Nolan, Steven Anton

Proceedings Volume 11381, 113812P (2020) https://doi.org/10.1117/12.2557545

KEYWORDS: Structural health monitoring, Electromagnetic coupling, LabVIEW, Transducers, Damage detection, Time metrology, Data acquisition, Signal detection, Computer programming

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Structural health monitoring (SHM) is a proven method for damage detection of static, slowly changing structures. However, there is a need to monitor structures in dynamic environments where damage may occur at much faster rates requiring evaluation in the microsecond to millisecond timescale (far below current measurement speeds). In recent years, advances in new SHM methods (along with data acquisition hardware and software) have opened the door to the measurement speeds necessary for continuously evaluating structures in dynamic environments. The electromechanical impedance (EMI) method offers excellent damage detection ability, and new electrical impedance measurement techniques have dramatically reduced the time of measurement. There are many areas that require further research to develop a fully functional microsecond SHM program using the EMI method. However, the current state of the art allows for preliminary testing for developing the algorithmic process necessary for a SHM program for continuous monitoring. This work discusses and develops the algorithmic process in a proof of concept program with LabVIEW. The program is tested in with an experiment to simulate damage as a change in boundary condition of a beam. Results indicate the program successfully completed the algorithmic process from raw data at an average of 20.47 ms on an Intel® Core™ i7-4470 processor on a 64-bit Windows 10 operating system (OS) with 8.00 GB of random-access memory (RAM) with a LabVIEW 2018 SP1 64-bit program, yielding tremendous promise and a foundation for more efficient future programs.

Proceedings Article | 1 April 2019 Presentation + Paper

Finite element evaluation of EMI-based structural health monitoring in high frequencies

Mohsen Safaei, Eric Nolan, Steven Anton

Proceedings Volume 10972, 109720C (2019) https://doi.org/10.1117/12.2514336

KEYWORDS: Ferroelectric materials, 3D modeling, Structural health monitoring, Aluminum, Data modeling, Electromagnetic coupling, Algorithm development, Optimization (mathematics), Electrodes, Sensors

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Structural health monitoring (SHM) is a growing field with many applications in the aerospace, civil, and mining industries. There has been a desire to develop SHM systems to operate in the microsecond timescale during highly dynamic events. Current efforts have focused on creating an impedance measurement system using the electromechanical impedance (EMI) method technique. In order to consider ways to decrease the time required to measure the impedance of a system, researchers have considered taking measurements at higher frequencies. As part of this research, it is important to consider the sensitivities and capabilities of the sensors to detect changes in the structure at higher frequencies (up to MHz). The goal for this study is to evaluate the sensitivity of the EMI method to damage using a PZT disk bonded to a cantilevered aluminum beam using a finite element (FE) model as well as experimental data. Damage was created by adding holes along the length of the beam, incrementally moving closer to the PZT disk. As a result of this study, an FE model has been developed using previously introduced methods to characterize the material properties of a PZT disk with an optimization algorithm. While initial coefficients resulted in a significant deviation of FE resonance peaks from experimental results, when using the optimized parameters the FE model accurately matches the experimental data. Modeling of the PZT when bonded to the aluminum beam showed a similar trend, there is not an exact match between the model and experimental data. This can be attributed to the material properties of the aluminum beam, which are from a general data sheet for the 6061-T6 and not data from the actual beam. In addition, the bonding layer is not modeled in the FE simulation, which can be a cause of the error in the modeling results. In both the model and experimental data, indications of damage from the impedance curves occurred below 600 kHz.

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