Dr. Monica Fernandez-Perea Profile

Dr. Monica Fernandez-Perea

at Ctr de Fisica "Miguel Antonio Catalan"

SPIE Involvement:

Author

Publications (18)

Proceedings Article | 27 September 2013 Paper

Paper

Corrosion-resistant Mg/SiC multilayer coatings for EUV laser sources in the 25-80nm wavelength region

Regina Soufli, Mónica Fernández-Perea, Jeff Robinson, Sherry Baker, Jennifer Alameda, Christopher Walton, Luis Rodríguez-De Marcos, Jose Méndez, Juan Larruquert, Manuela Vidal-Dasilva, Eric Gullikson

Proceedings Volume 8849, 88490D (2013) https://doi.org/10.1117/12.2024955

KEYWORDS: Scanning electron microscopy, Laser sources, Transmission electron microscopy, Extreme ultraviolet, Aluminum, Magnesium, Silicon carbide, Reflectivity, Corrosion, Multilayers

Read Abstract +

Proceedings Article | 26 September 2013 Paper

Paper

Hard x-ray/soft gamma-ray telescope designs for future astrophysics missions

Desiree Della Monica Ferreira, Finn Christensen, Michael Pivovaroff, Nicolai Brejnholt, Monica Fernandez-Perea, Niels Jørgen Westergaard, Anders Jakobsen, Marie-Anne Descalle, Regina Soufli, Julia Vogel

Proceedings Volume 8861, 886116 (2013) https://doi.org/10.1117/12.2024986

KEYWORDS: Multilayers, Mirrors, Telescopes, Astrophysics, Optical instrument design, Optical coatings, Gamma radiation, Telescope design, Glasses, Silicon

Read Abstract +

Proceedings Article | 6 August 2013 Paper

Paper

Development, experimental performance and damage properties of x-ray optics for the LCLS free-electron laser

Regina Soufli, Mónica Fernández-Perea, Jacek Krzywinski, David Rich, Sherry Baker, Jeff Robinson, Stefan Hau-Riege, Eric Gullikson, Valeriy Yashchuk, Wayne McKinney, Philip Heimann, William Schlotter, Michael Rowen, Paul Montanez, Sébastien Boutet

Proceedings Volume 8777, 877702 (2013) https://doi.org/10.1117/12.2019197

KEYWORDS: Liquid crystal lasers, Coating, Mirrors, X-rays, Reflectivity, Free electron lasers, X-ray optics, Atomic force microscopy, Carbon, Silicon carbide

Read Abstract +

Proceedings Article | 19 October 2012 Paper

Paper

A soft x-ray beam-splitting multilayer optic for the NASA GEMS Bragg Reflection Polarimeter

Ryan Allured, Mónica Fernández-Perea, Regina Soufli, Jennifer Alameda, Alicia Maxwell, Michael Pivovaroff, Eric Gullikson, Philip Kaaret

Proceedings Volume 8502, 850206 (2012) https://doi.org/10.1117/12.930093

KEYWORDS: X-ray detectors, Space operations, Sensors, Coating, X-ray optics, Polarimetry, Polarization, Prototyping, Multilayers, X-rays

Read Abstract +

Proceedings Article | 19 October 2012 Paper

Paper

An examination of the sensitivity and systematic error of the NASA GEMS Bragg Reflection Polarimeter using Monte-Carlo simulations

Ryan Allured, Takashi Okajima, Regina Soufli, Mónica Fernández-Perea, Ryan Daly, Hannah Marlowe, Scott Griffiths, Michael Pivovaroff, Philip Kaaret

Proceedings Volume 8487, 848703 (2012) https://doi.org/10.1117/12.930065

KEYWORDS: Modulation, Polarization, Polarimetry, Space operations, Reflectors, Sensors, Monte Carlo methods, Photons, X-rays, Phase shift keying

Read Abstract +

Proceedings Article | 15 October 2012 Paper

Paper

Review of substrate materials, surface metrologies and polishing techniques for current and future-generation EUV/x-ray optics

Regina Soufli, Sherry Baker, Eric Gullikson, Tom McCarville, Jeffrey Robinson, Dennis Martínez-Galarce, Mónica Fernández-Perea, Michael Pivovaroff

Proceedings Volume 8501, 850102 (2012) https://doi.org/10.1117/12.954852

KEYWORDS: Polishing, Hard x-rays, Liquid crystal lasers, X-rays, Metrology, Silicon, Extreme ultraviolet lithography, Spatial frequencies, Silicon carbide, Mirrors

Read Abstract +

Proceedings Article | 17 September 2012 Paper

Paper

Corrosion-resistant high-reflectance Mg/SiC multilayer coatings for solar physics in the 25-80 nm wavelength region

Regina Soufli, Monica Fernández-Perea, Jeff Robinson, Sherry Baker, Jennifer Alameda, Eric Gullikson

Proceedings Volume 8443, 84433R (2012) https://doi.org/10.1117/12.926589

KEYWORDS: Multilayers, Corrosion, Reflectivity, Magnesium, Silicon carbide, Aluminum, Solar processes, Mirrors, Space telescopes, Transmission electron microscopy

Read Abstract +

Proceedings Article | 17 September 2012 Paper

Paper

In-band and out-of-band reflectance calibrations of the EUV multilayer mirrors of the atmospheric imaging assembly instrument aboard the Solar Dynamics Observatory

Regina Soufli, Eberhard Spiller, David Windt, Jeff Robinson, Eric Gullikson, Luis Rodriguez-de Marcos, Monica Fernandez-Perea, Sherry Baker, Andrew Aquila, Franklin Dollar, José Antonio Méndez , Juan Larruquert, Leon Golub, Paul Boerner

Proceedings Volume 8443, 84433C (2012) https://doi.org/10.1117/12.927274

KEYWORDS: Reflectivity, Mirrors, Multilayers, Extreme ultraviolet, Statistical modeling, Calibration, Data modeling, Silicon, Space telescopes, Silicon carbide

Read Abstract +

Proceedings Article | 7 October 2011 Paper

Paper

First results from the ground calibration of the NuSTAR flight optics

Jason Koglin, HongJun An, Nicolas Barrière, Nicolai Brejnholt, Finn Christensen, William Craig, Charles Hailey, Anders Clemen Jakobsen, Kristin Madsen, Kaya Mori, Melania Nynka, Monica Fernandez-Perea, Michael Pivovaroff, Andrew Ptak, Clio Sleator, Doug Thornhill, Julia Vogel, Daniel Wik, William Zhang

Proceedings Volume 8147, 81470J (2011) https://doi.org/10.1117/12.895279

KEYWORDS: Mirrors, Calibration, X-ray optics, Point spread functions, Sensors, Coating, Multilayers, X-rays, Error analysis, Data modeling

Read Abstract +

Proceedings Article | 5 May 2011 Paper

Paper

Lifetime and damage threshold properties of reflective x-ray coatings for the LCLS free-electron laser

Regina Soufli, Mónica Fernández-Perea, Stefan Hau-Riege, Sherry Baker, Jeff Robinson, Eric Gullikson, John Bozek, Nicholas Kelez, Sebastien Boutet

Proceedings Volume 8077, 807702 (2011) https://doi.org/10.1117/12.887747

KEYWORDS: Hard x-rays, Atomic force microscopy, Silicon, Laser damage threshold, Silicon carbide, Free electron lasers, Reflectivity, X-rays, Liquid crystal lasers, Mirrors

Read Abstract +

Proceedings Article | 4 May 2011 Paper

Paper

Multilayer coatings for the far and extreme ultraviolet

Juan Larruquert, Manuela Vidal-Dasilva, Sergio García-Cortés, Luis Rodríguez-de Marcos, Mónica Fernández-Perea, José Aznárez, José Méndez

Proceedings Volume 8076, 80760D (2011) https://doi.org/10.1117/12.886856

KEYWORDS: Multilayers, Reflectivity, Absorption, Extreme ultraviolet, Optical coatings, Lanthanides, Ytterbium, Aluminum, Laser induced fluorescence, Magnesium fluoride

Read Abstract +

Proceedings Article | 9 September 2009 Paper

Paper

Narrowband multilayer mirrors for the extreme ultraviolet spectral range of 50 to 95 nm

M. Vidal-Dasilva, M. Fernández-Perea, J. I. Larruquert, J. A. Méndez, J. A. Aznárez

Proceedings Volume 7448, 74480N (2009) https://doi.org/10.1117/12.827969

KEYWORDS: Multilayers, Reflectivity, Aluminum, Extreme ultraviolet, Ytterbium, Absorption, Lanthanides, Mirrors, Dendrites, Optical coatings

Read Abstract +

Proceedings Article | 25 September 2008 Paper

Paper

Characterization of the optical constants of materials from the visible to the soft x-rays

Juan Larruquert, Mónica Fernández-Perea, Manuela Vidal-Dasilva, José Aznárez, José Méndez, Luca Poletto, Denis Garoli, A. Marco Malvezzi, Angelo Giglia, Stefano Nannarone

Proceedings Volume 7101, 71010W (2008) https://doi.org/10.1117/12.797419

KEYWORDS: Absorption, Visible radiation, Ytterbium, Europium, Electrons, X-rays, Thin films, Refractive index, Lanthanides, Transmittance

Read Abstract +

Proceedings Article | 16 September 2008 Paper

Paper

Transmittance and optical constants of evaporated Pr, Eu, and Tm films in the 4-1600 eV spectral range

M. Fernández-Perea, M. Vidal-Dasilva, J. Aznárez, J. Larruquert, J. Méndez, L. Poletto, D. Garoli, A. Malvezzi, A. Giglia, S. Nannarone

Proceedings Volume 7077, 707715 (2008) https://doi.org/10.1117/12.795100

KEYWORDS: Europium, Thulium, Transmittance, Thin films, Absorption, Refraction, Mass attenuation coefficient, Electrons, Lanthanides, Reflectivity

Read Abstract +

Proceedings Article | 18 July 2008 Paper

Paper

Narrowband filters and broadband mirrors for the spectral range from 50 to 200 nm

M. Fernández-Perea, M. Vidal-Dasilva, J. Larruquert, J. Méndez, J. Aznárez

Proceedings Volume 7018, 70182W (2008) https://doi.org/10.1117/12.789451

KEYWORDS: Silicon carbide, Gold, Optical coatings, Transmittance, Optical filters, Multilayers, Aluminum, Magnesium fluoride, Mirrors, Reflectivity

Read Abstract +

Proceedings Article | 21 September 2006 Paper

Paper

Determination of the transmittance and extinction coefficient of Yb films in the 23-1700 eV range

Juan Larruquert, Mónica Fernández-Perea, José Aznárez, José Méndez, Luca Poletto, Denis Garoli, A. Marco Malvezzi, Angelo Giglia, Stefano Nannarone

Proceedings Volume 6317, 63170S (2006) https://doi.org/10.1117/12.680930

KEYWORDS: Aluminum, Multilayers, Absorption, In situ metrology, Extreme ultraviolet, Thin films, Reflectivity, Mass attenuation coefficient, Transmittance, Ytterbium

Read Abstract +

Proceedings Article | 29 August 2006 Paper

Paper

Transmittance and reflective coatings for the 50-200-nm spectral range

Mónica Fernández-Perea, Juan Larruquert, José Aznárez, José Méndez

Proceedings Volume 6317, 63170L (2006) https://doi.org/10.1117/12.680987

KEYWORDS: Optical filters, Gold, Thin films, Thin film coatings, Optical coatings, Multilayers, Aluminum, Silicon carbide, Transmittance, Reflectivity

Read Abstract +

Proceedings Article | 29 August 2006 Paper

Paper

Transmittance and extinction coefficient of Ce films measured in situ in the extreme ultraviolet and soft x-rays

Mónica Fernández-Perea, José Aznárez, Juan Larruquert, José Méndez, Luca Poletto, Denis Garoli, A. Marco Malvezzi, Angelo Giglia, Stefano Nannarone

Proceedings Volume 6317, 63170V (2006) https://doi.org/10.1117/12.684339

KEYWORDS: Thin films, In situ metrology, Reflectivity, Lanthanides, Extreme ultraviolet, Refractive index, Absorption, Mass attenuation coefficient, Transmittance, Cerium

Read Abstract +

Showing 5 of 18 publications

SIGN IN TO:

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Advertisement

Advertisement