Dr. Patricia Liebing
at Univ College London
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 23 August 2024 Presentation + Paper
R. Laureijs, R. Vavrek, G. Racca, R. Kohley, P. Ferruit, V. Pettorino, T. Bönke, A. Calvi, L. Gaspar Venancio, L. Campos, E. Maiorano, O. Piersanti, S. Prezelus, U. Ragnit, P. Rosato, C. Rosso, H. Rozemeijer, A. Short, P. Strada, D. Stramaccioni, M. Szafraniec, B. Altieri, G. Buenadicha, X. Dupac, P. Gómez Cambronero, K. Henares Vilaboa, C. Hernandez de la Torre, J. Hoar, M. Lopez-Caniego Alcarria, P. Marcos Arenal, J. Martin Fleitas, M. Miluzio, A. Mora, S. Nieto, R. Perez Bonilla, P. Teodoro Idiago, F. Cordero, J. Mendes, F. Renk, A. Rudolph, M. Schmidt, J. Schwartz, Y. Mellier, H. Aussel, M. Berthé, P. Casenove, M. Cropper, J. Cuillandre, J. Dinis, A. Gregorio, K. Kuijken, T. Maciaszek, L. Miller, R. Scaramella, M. Schirmer, I. Tereno, A. Zacchei, S. Awan, G. Candini, P. Liebing, R. Nakajima, S. Dusini, P. Battaglia, E. Medinaceli, C. Sirignano, I. Baldry, C. Baugh, F. Bernardeau, F. Castander, A. Cimatti, W. Gillard, L. Guzzo, H. Hoekstra, K. Jahnke, T. Kitching, E. Martin, J. Mohr, W. Percival, J. Rhodes
Proceedings Volume 13092, 130920M (2024) https://doi.org/10.1117/12.3020343
KEYWORDS: Space operations, Telescopes, Equipment, Calibration, Point spread functions, Ice, Photometry, Contamination, Extragalactic astronomy, Cosmology

Proceedings Article | 23 August 2024 Presentation + Paper
Proceedings Volume 13092, 130920P (2024) https://doi.org/10.1117/12.3017996
KEYWORDS: Silicon, Charge-coupled devices, Sensors, Calibration, Manufacturing, Space operations, Semiconducting wafers

Proceedings Article | 29 August 2022 Presentation + Paper
Proceedings Volume 12191, 121911F (2022) https://doi.org/10.1117/12.2629896
KEYWORDS: Calibration, Charge-coupled devices, Data modeling, Electrons, Sensors, Galactic astronomy, Computer simulations, Data corrections, Solid modeling, Image sensors

Proceedings Article | 13 December 2020 Poster + Paper
Thibaut Prod'homme, Patricia Liebing, Peter Verhoeve, Ilya Menyaylov, Frédéric Lemmel, Hans Smit, Sander Blommaert, Dennis Breeveld, Brian Shortt
Proceedings Volume 11454, 1145426 (2020) https://doi.org/10.1117/12.2561760
KEYWORDS: Sensors, Projection systems, Photomasks, Point spread functions, Astronomy, Photometry, Spectroscopes, Temperature metrology, Lithography, Manufacturing

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