Dr. Reiko Nakajima
at Argelander-Institut für Astronomie
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 August 2024 Presentation + Paper
Proceedings Volume 13092, 130920P (2024) https://doi.org/10.1117/12.3017996
KEYWORDS: Silicon, Charge-coupled devices, Sensors, Calibration, Manufacturing, Space operations, Semiconducting wafers

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