Shingo Ishida
at Canon inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 26 August 2024 Paper
Proceedings Volume 13177, 1317709 (2024) https://doi.org/10.1117/12.3032446
KEYWORDS: Nanoimprint lithography, Artificial intelligence, Lithography, Overlay metrology, Metrology, Optical lithography, Data modeling, Manufacturing, Computer simulations, Semiconducting wafers

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12954, 129540Z (2024) https://doi.org/10.1117/12.3009839
KEYWORDS: Nanoimprint lithography, Artificial intelligence, Lithography, Metrology, Computer simulations

Proceedings Article | 30 April 2023 Presentation
Proceedings Volume 12495, 124950N (2023) https://doi.org/10.1117/12.2657058
KEYWORDS: Nanoimprint lithography, Optical lithography, Ultraviolet radiation, Physics, Performance modeling, Nanotechnology, Manufacturing equipment, Manufacturing, Lithography, Device simulation

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