Mr. Vladimir V. Zabrodsky Profile

Vladimir V. Zabrodsky

senior researcher at Ioffe Institute

SPIE Involvement:

Author

Area of Expertise:

silicon photodiodes , VUV , metrology , EUV

Publications (2)

SPIE Journal Paper | 21 July 2021 Open Access

Silicon avalanche photodiode with photon detection efficiency superior to 0.65 electrons/photon in the wavelength range of 114 to 170 nm

Pavel Aruev, Victor P. Belik, Vladimir Zabrodsky, Andrey Nikolaev, Evgeniy Sherstnev

OE, Vol. 60, Issue 07, 077103, (July 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.7.077103

KEYWORDS: Silicon, Sensors, Photodiodes, Vacuum ultraviolet, Photodetectors, Quantum efficiency, Avalanche photodiodes, Absorption, Calibration, Aluminum

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Proceedings Article | 3 May 2013 Paper

Study of EUV and x-ray radiation hardness of silicon photodiodes

Vladimir Zabrodsky, Pavel Aruev, Vladimir Filimonov, Nikolay Sobolev, Evgeniy Sherstnev, Viktor Belik, Anton Nikolenko, Denis Ivlyushkin, Valery Pindyurin, Nikita Shadrin, Artem Soldatov, Mikhail Mashkovtsev

Proceedings Volume 8777, 87770R (2013) https://doi.org/10.1117/12.2017478

KEYWORDS: Photodiodes, Silicon, Visualization, Extreme ultraviolet, X-rays, Extreme ultraviolet lithography, Mirrors, Sensors, Silica, Optical filters

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